1 May 2020 Chronos partner Microchip Technology Inc. (Nasdaq: MCHP) has announced the release of the 53100A Phase Noise Analyzer for precision oscillator characterisation. This next generation phase noise test instrument combines timing technologies in a smaller, higher-performance measurement instrument and is designed to help research and manufacturing engineers make precise and accurate measurement of frequency signals, including those generated by atomic clocks and other high-performance frequency reference modules and subsystems.

Designed specifically for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centers, commercial and military aircraft systems, space vehicles, communication satellites and metrology applications, the 53100A Phase Noise Analyzer is capable of measuring radio frequency (RF) signals up to 200 MHz. The new test instrument rapidly acquires frequency signals and characterizes the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) quickly and precisely. All attributes of a frequency reference can be completely characterised with a single instrument within minutes.

The 53100A Phase Noise Analyzer enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, enabling higher capacity for stability measurements. At 344 x 215 x 91mm  (13.5 x 8.5 x 3.6 inches), the phase noise test instrument is small enough for integration into manufacturing Automated Test Equipment (ATE) systems, yet powerful enough for laboratory-grade metrology. Its interface provides backward compatibility with Microchip’s 51xxA test sets’ command and data stream, reducing the need to redesign existing ATE infrastructure.

The 53100A Phase Noise Analyzer enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, enabling higher capacity for stability measurements. At 344 x 215 x 91mm  (13.5 x 8.5 x 3.6 inches), the phase noise test instrument is small enough for integration into manufacturing Automated Test Equipment (ATE) systems, yet powerful enough for laboratory-grade metrology. Its interface provides backward compatibility with Microchip’s 51xxA test sets’ command and data stream, reducing the need to redesign existing ATE infrastructure.

The 53100A Phase Noise Analyzer provides flexibility by allowing an input reference device to be connected through the front panel at a different nominal frequency than the device under test – allowing a single reference to characterize a variety of oscillator products. Rubidium frequency standards such as Microchip’s 8040C-LN or a quartz oscillator such as Microchip’s 1000C Ovenized Crystal Oscillator (OCXO) could be used as a reference as well as other manufacturers’ precise oscillators.

More Information about 53100 Phase Noise Analyzer

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